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Patent US4843329 - Method for contactless testing for electrical opens and short circuits in ... - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inPatentsA method for contactlessly testing for opens and shorts in conducting paths within or on a nonconducting substrate. There are a plurality of conducting pads on the surface of the substrate. Charges are contactlessly generated, e.g., by an optical beam, in at least one selected pad inducing a voltage...http://www.google.com/patents/US4843329?utm_source=gb-gplus-sharePatent US4843329 - Method for contactless testing for electrical opens and short circuits in conducting paths in a substrateAdvanced Patent SearchTry the new Google Patents, with machine-classified Google Scholar results, and Japanese and South Korean patents.Publication numberUS4843329 APublication typeGrantApplication numberUS 07/107,433Publication dateJun 27, 1989Filing dateOct 9, 1987Priority dateOct 23, 1986Fee statusLapsedAlso published asDE3685331D1, EP0264481A1, EP0264481B1Publication number07107433, 107433, US 4843329 A, US 4843329A, US-A-4843329, US4843329 A, US4843329AInventorsJohannes G. Beha, Armin U. Blacha, Rolf Clauberg, Hugo K. SeitzOriginal AssigneeInternational Business Machines CorporationExport CitationBiBTeX, EndNote, RefManPatent Citations (9), Non-Patent Citations (12), Referenced by (47), Classifications (15), Legal Events (6) External Links: USPTO, USPTO Assignment, EspacenetMethod for contactless testing for electrical opens and short circuits in conducting paths in a substrate
US 4843329 AAbstract
A method for contactlessly testing for opens and shorts in conducting paths within or on a nonconducting substrate. There are a plurality of conducting pads on the surface of the substrate. Charges are contactlessly generated, e.g., by an optical beam, in at least one selected pad inducing a voltage thereon and on pads electrically connected therewith through one of the conducting paths. A two dimensional electron flux is contactlessly caused to be emitted from the selected pad and at least one other pad of the plurality of pads, e.g., by an optical beam. The flux emitted from the pads depends on the voltage on each pad. The flux is detected to distinguish pads in electrical connection.
1. A method of testing the integrity of conducting paths within or on a circuit substrate consisting of nonconducting material, each said conducting path being connected to at least two uncovered pads on any one face of said substrate, comprising:(a) generating charges in at least one selected pad on one face of said substrate by focusing an optical beam onto said selected pad, the energy of said beam being sufficient to cause photoelectron emission from each selected pad but insufficient to cause photoelectron emission from said nonconducting substrate material, said photoelectron emission inducing a specific voltage level in each selected pad and in each nonselected pad which is electrically connected to said selected pad; (b) thereafter, causing voltage-dependent photoelectron emission from pads on any one face of said substrate by irradiating said face with a flooding optical beam, of sufficient energy to cause said voltage-dependent photoelectron emission, the magnitude of said voltage-dependent photoelectron emission from each pad depends on the voltage thereon; and (c) detecting said voltage dependent photoelectron emission to distinguish pads in electrical connection with said at least one selected pad. 2. The method of claim 1, wherein said method is carried out in vacuum.
3. The method of claim 1, wherein steps (a), (b), and (c) are all conducted on the same face of said substrate, for testing the integrity of electrical connections between at least one pair of pads, both of which being located on the same face of said substrate.
4. The method of claim 1, wherein step (a) is conducted on a first face of said substrate, and steps (b) and (c) are conducted on a second face of said substrate, for testing the integrity of conducting via connections extending within said substrate from at least one pad on said first face to at least one pad on said second face.
5. The method of claim 4, wherein said substrate is turned over by 180 degrees between step (a) and step (b), so that said step of generating charges and said step of detecting can be done from one side of the location of said substrate.
6. The method of claim 4, wherein said substrate is not moved during the whole testing operation, said charges being generated by focusing said optical beam onto said selected pads from a first side of said substrate's location, and said voltage-dependent photoemission being caused by directing said flooding optical beam from a second side of said substrate's location, said voltage-dependent photoemission being detected from said second side.
7. The method of claim 1, further comprising prior to said step of detecting:accelerating the electrons emitted by voltage-dependent photoelectron emission away from said substrate by providing an accelerating voltage, and providing a retarding voltage to substantially prevent electrons emitted from pads having a voltage level induced thereon from being detected. 8. The method of claim 1, wherein said voltage-dependent photoelectron emission is detected by evaluating the output of a position-sensitive channel plate arrangement located in the vicinity of said substrate face irradiated with said flooding optical beam.
9. The method of claim 8, wherein the output of said position-sensitive channel plate arrangement is evaluated by exciting a pattern in an electoluminescent layer, said pattern being detected by a scanning electronic camera.
10. A method of testing the integrity of conducting via connections in a circuit substrate consisting of non-conducting material, each of said via connections having one pad on a first surface of said substrate and at least one pad on a second surface of said substrate, comprising:(a) generating charges in all pads on said first surface by flooding onto said first surface an optical beam having energy sufficient to cause photoelectron emission from said pads but insufficient to cause photoelectron emission from said non-conducting substrate material, said photoelectron emission inducing a voltage in each pad on said first surface and in each pad on said second surface which is electrically connected to a pad on said first surface; (b) thereafter, causing voltage-dependent photoelectron emission from pads on said second surface by irradition with a flooding optical beam of sufficient energy to cause said voltage-dependent photoemission, the magnitude of said voltage-dependent photoemission from each pad depends on the voltage thereon; and (c) detecting the pattern of said voltage-dependent photoelectron emission to distinguish pads on said second surface in electrical connection with pads on said first surface. 11. A method for contactlessly testing the integrity of conducting paths within or on a nonconducting substrate, there being a plurality of pads on the surface of said substrate, comprising;contactlessly generating charges in at least one pad of said plurality of pads inducing a voltage thereon and on pads electrically connected therewith through one of said conducting paths, substantially no charges being generated in said substrate; contactlessly causing a two dimensional electron flux to be emitted from said at least one pad and from at least one other pad of said plurality of pads, said flux emitted from each pad depending on the voltage thereon, substantially no electron flux being emitted from said substrate; and detecting the two dimensional voltage dependent electron flux being emitted from said at least one pad and from said at least one other pad of said plurality of pads to distinguish pads in electrical connection with said at least one pad, pads in electrical connection with said at least one pad emitting substantially the same flux, pads not in electrical connection with said at least one pad emitting a different flux than said at least one pad. 12. The method of claim 11, wherein charges are contactlessly generated in said at least one pad by directing a first optical beam thereon sufficiently focused and of sufficient energy to photoelectrically remove electrons therefrom, the energy of said first optical beam being insuffficient to generate charges in said substrate and wherein said electron flux is emitted from said plurality of pads by directing a second optical beam thereon, said second optical beam being sufficiently focused and of sufficient energy to photoelectrically emit electrons from said plurality of pads, the energy of said second optical beam being insufficient to emit electrons from said substrate.
13. The method of claim 11, wherein said method is carried out in vacuum.
14. The method of claim 11, wherein said two dimensional electron flux is detected by directing said flux onto an electroluminescent layer exciting a pattern therein and by measuring said pattern.
15. The method of claim 12, wherein said first and said second optical beams are laser beams.
16. The method of claim 11, further comprising, prior to said step of detecting said two dimensional voltage dependent flux being emitted from said plurality of pads, applying an electric field to direct said electron flux away from said substrate and to substantially prevent electrons emitted into said electric field from a pad having a voltage induced thereon from passing through said electric field.
17. The method of claim 16, wherein the electron flux passing through said electric field is amplified prior to said step of detecting.
18. The method of claim 16 wherein the electron flux emitted from said plurality of pads is amplified prior to said step of applying said electric field.
Copending U.S. patent application Ser. No. 07/107,441 filed on the same date as the present application entitled "METHOD FOR CONTACTLESS TESTING OF CONDUCTING PATHS IN A SUBSTRATE USING PHOTON-ASSISTED TUNNELING" of J. G. Beha et al, and assigned to the same assignee as the present invention, describes a method for contactless testing the integrity of conducting path on or in a substrate, by executing the following steps: (I) selected pads are irradiated by an optical beam so that they are positively charged due to photoemission of electrons. The charges propagate through existing conductors so that all selected pads and all pads connected to them assume a specific voltage. (II) The whole surface is irradiated by a flooding optical beam. Photoemission of electrons will now occur from those pads which were not charged previously. (III) The photoelectrons emitted in step II are detected thus revealing the spatial distribution of uncharged pads, permitting detection of line opens and shorts of conducting paths.
The present invention is concerned with the testing of electrical connecting in substrates, and in particular with the testing of interconnection lines and via connections in circuit boards for packaging integrated circuit chips. It is generally suited for testing conducting lines and via connections in substrates.
In principle, testing can be done by applying power and data signals to circuitry and extracting resulting data signals and electrical conditions from circuitry through the regular connection pins or through mechanical contact probes. Such testing is, however, slow and not very effective because of the limited number of connections which can be made. It is therefore not well suited for highly integrated circuits and dense packaging which are used today.
Therefore, some methods of contactless testing have been recently suggested using either electron beam or laser technology. E-beam testing was described in an article by E. Menzel et al.: "Fundamentals of Electron Beam Testing of Integrated Circuits", published in Scanning, Vol. 5 (1983), pp. 103-122. The E-beam is used as a contactless probe, either in a passive or active mode. However, the utilization of electron beams for testing has certain disadvantages and limitations. Scanning or flooding a substrate by an E-beam leads also to the charging of the substrate because the incident electrons have energies much larger than the work function of the substrate, i.e. they produce secondary electrons. This strongly influences the voltage contrast between different points on a substrate and hinders the measurements. Furthermore, reflected high energy electrons strongly complicate simultaneous measurement for many different points using position-sensitive detectors because these high energy electrons must be separated from the lower energy electrons which carry the required information.
More recently, the use of an optical beam, e.g. a laser beam, for integrated circuit testing has been suggested. The photons of a laser beam can excite electron emission from the target, and the laser beam can thus be used for contactless testing of electronic circuitry.
European Patent Application No. 0,205,760 (U.S. counterpart issued as U.S. Pat No. 4,670,710) entitled "Noncontact Testing of Integrated Circuits" discloses a technique of directing a laser beam in a scanning motion to lines of test points so that photoelectrons are generated in dependance of the operating conditions of those test points. The generated electrons are then directed to a two-dimensional array electron detector so that an analysis can be made.
In European Patent Application No. 0,216,077 (U.S. counterpart application Ser. No. 778,823 filed Sept. 23, 1985) a testing procedure is described in which laser light is directed to the entire surface of a circuit chip, and in which that laser light causes generation of photoelectrons in dependance of the voltage present at each point. The electrons generated are directed either to a luminescent target whose image is then evaluated, or the electrons are directed to channel plates and further to a luminescent target and an optical processing system.
It is a primary object of present invention to provide a testing method which is completely contactless and thus does not require the establishment of connections for the application of power and test data to the circuits to be tested.
Another object of the invention is to provide a testing procedure which does not require application of electron beams and which thus can achieve high voltage contrasts.
In the invented method for achieving these objects, an optical beam, e.g. a laser beam, is first applied to predetermined pads of circuitry on a substrate to cause photoemission therefrom so that they are charged positively; this will bring these predetermined pads and all conducting lines and pads connected to each of them to a particular voltage level. Thereafter, the same or another optical beam is directed to the board surface a second time to excite photoemission from pads, whose intensity is now depending on the voltage previously established at each pad. The photoelectrons can be detected by being directed to a channel plate arrangement for amplification, and the resulting pattern of intensities is evaluated to thus detect which pads are actually in electrical connection with the predetermined pads and which are not.
This method has the advantage that it can be used for surface lines, buried lines, as well as for via connections. It allows the simultaneous testing of several connections which is e.g. not possible with E-beam technology.
FIG. 1A, FIG. 1B and FIG. 1C are a schematic representation of the sequential steps of the invented testing method for testing connections between pads on one side of a circuit board;
The testing procedure of the present invention is of primary interest for packaging, i.e. for testing the circuits and conducting lines which are provided between pads on circuit boards. Such circuit boards are used for carrying and interconnecting individual chips which were tested already previously.
FIG. 1 is a schematic representation of the new testing method. The three main steps of the method are represented in the three portions FIG. 1A, FIG. 2B and FIG. 1C of the drawing. Electrons photoemitted from a surface into a nonevacuated ambient such as air can interact with the atoms or molecules on the ambient decreasing the number of photoemitted electrons available for detection. It is therefore the preferred embodiment that the testing be done in vacuum, to enhance photoemitted collection of the electrons photoemitted from a surface which is irradiated by an optical beam.
For convenience, the invention will be further described in terms of the use of a laser as the source of an optical beam. However, it should be understood that the method is not limited to the use of a laser. In the first step (I) shown in FIG. 1A, a substrate 11, e.g., a circuit board, containing the circuits or conductors to be tested is subjected to a laser beam from laser device 13, e.g., an ultraviolet laser. The laser beam can be directed to selected spots on the board 11 by a scanning mechanism, and it can be switched on and off. There are shown two pairs of pads P11/P12 and P21/P22, each pair being interconnected by a conductor which is to be tested. For a conductor on the surface of the substrate, the pad can be any part of the conductor. For a conductor within the substrate, a pad is an extension of the conductor to the surface of the substrate. In this first step, one of the pads, e.g. P21, is subjected to the laser beam. Due to photoemission from the conducting material at this spot, pad 21 will be charged positively, but not the surrounding insulator surface of board 11. The reason for this good contrast is the fact that the photon energy for the laser irradiation is chosen such that it is large enough to excite photoelectrons from the metallic pads, but is too small to excite photoelectrons from the insulating substrate, for example, a ceramic substrate. A grid can be provided for collecting the generated photoelectrons (as discussed in section 2).
The charges collecting on the selected pad P21 will propagate through all portions of the electrical circuitry which are connected to P21, in this case through the conductor to pad P22. Thus, at the end of step (I), P21 and also P22 should be at a different potential than all other surface spots of the board, if the circuitry between P21 and P22 is intact. However, if there would be a discontinuity in the conductor between P21 and P22, P22 would not be at the higher potential; furthermore, if there would be a short circuit connection between P21 and P12, the charges would distribute to both pads P12 and P11 so that both would be at the higher potential which is also present on P21 and P22. The specific voltage level at the selected pads and pads connected to them will depend on the laser power used, the irradiation time, and the conductor material.
Therefore, by first selectively charging selected points of the circuitry to be tested, and then detecting on which non-irradiated spots the higher potential appears, defects in the circuitry or conductors can be determined. Steps (II), shown in FIG. 1B, and (III), shown in FIG. 1C, are executed for the detecting operation which actually is a voltage-contrast measurement. In step (II), the whole surface of board 11 is flooded by a wide-spread laser beam from laser device 13. This will cause photoemission from all metallic points. But the electrons from the previously charged spots will have a lower kinetic energy than the electrons from uncharged spots. These lower energy electrons will not be able to pass through a barrier to a detection arrangement. Thus, there will be no detectable photoemission from these metallic spots which are at a higher potential than the other metallic spots on the surface of board 11; in the case of intact circuitry, these spots would be pads P21 and P22 in the present example.
In step (III), shown in FIG. 1C, the electron flux pattern photoemitted from noncharged metallic surface areas is detected. One method of detection is an arrangement of channel plates 15 and a position-sensitive detector 17. Such channel plates 15 are a high-density array of electron multiplier plates and are well known. They produce a high gain in the photoelectron flux intensity. Position-sensitive detector 17 which may be a luminescent phosphor plate or a semiconductor plate of which each spot can be charged separately reveals the spatial distribution of detected electrons which is an indication of the location of all uncharged metallic spots on the board's surface. This spatial information can be converted to time-sequential data sequence and then e.g. be stored or directly processed in a computer for obtaining the test results. Electrical grid means are provided for example, between the board 11 and the channel plates 15, to supply an electric field to collect the higher energy photoelectrons and to refuse the lower energy photoelectrons. These details will be explained in the following section 2.
So far, the testing was only done on one side of the board. For testing via connections, i.e. conductors between pads on different surfaces of the board, the board would either have to be turned over after step (I), shown in FIG. 1A,--if the induced charges sustain for a sufficient long time--or a flooding laser and the channel plate/detector arrangement would have to be provided on the other side of the board, as is shown in FIG. 2. In the case of FIG. 2, via connections are provided between pairs of pads P31/P32 . . . P61/P62, respectively, which are located on opposite sides 11A and 11B of the board. Otherwise, procedure steps I, II, and III, shown in FIG. 2A, FIG. 2B and FIG. 2C respectively, correspond to those described in connection with FIG. 1.
There is of course also the possibility of testing all via connections in a board simultaneously. In this case, step (I), shown in FIG. 2A, of the procedure would consist of flooding the whole surface area 11A with a laser beam to charge all via pads located on that side of the board. Then, for all intact vias the respective pads on the other surface 11B would be charged; for each interrupted via, the corresponding pad on the other surface 11B would have no charge. Steps (II) and (III), shown in FIG. 2B and FIG. 2C respectively, for simultaneous via testing are the same as for individual via testing: flooding of the whole other surface 11B by a laser beam, and detecting the photoemission pattern by the channel plate/detector arrangement.
FIG. 3 illustrates a testing facility in which the invention is used. This facility includes a vacuum chamber 19 having a base plate 21. A support 23 is provided for holding circuit board (package substrate) 11. On the surface of board 11, electrical connection pads 25 are shown schematically. Circuits or conductors to be tested are not shown in this drawing.
Laser device 13 comprises a source 27 of ultraviolet laser light and a scanner/flooder arrangement 29. Scanner/flooder 29 is a suitable means for focusing and deflecting the laser beam emitted from source 27 to selected points on board 11, or for providing a wide-angle laser beam covering the whole surface of board 11. The scanner/flooder may be a commercial system as used in purely optical laser scanning microscopes, based on a rotating polygon mirror plus focusing/beam spreading objective. As such focusing and deflection means are well known they need not be described here in more detail.
A control unit 31 is provided for furnishing suitable control signals for laser source 27 (switching the beams on and off) and for scanner/flooder 29 (coordinate signals for selected points to be charged for testing, or control signal for providing a wide-angle laser beam). The basic data for any testing procedure are stored in a processor/storage 33, and are furnished to control unit 31.
Channel plates 15 are provided for receiving in true spatial relationship the photoelectrons emitted from the surface of board 11 in response to the flooding by a laser beam in step (II), shown in FIG. 1B. Two grids are provided to supply electric field for collecting photoelectrons from selected pads in step (I), shown in FIG. 1A and for achieving a good transfer of photoelectrons to the channel plate arrangement in step (II): An accelerating grid 35 which has an electrical potential (VACC) that attracts and thus accelerates the photoelectrons from board 11. A typical potential for this grid 35 would be 100 Volts. To refuse the lower energy photoelectrons and thus to enable voltage discrimination, a retarding grid 37 is provided which has a retarding potential (VRET) to slow down the electrons which have passed grid 35. A typical potential for this grid 37 would be between -10 Volts and +10 Volts. A voltage source 39 is provided for furnishing the potentials (VACC) and (VRET) to the grids. It receives control signals for selecting the correct grid potentials from control unit 31.
The electrons furnished by channel plates 15, which represent the spatial distribution of potentials of metallic spots on the surface of board 11 propagate to position-sensitive detector 17. If this is a luminescent layer, its image can be recorded by a TV camera. The scanning signals of this camera which are sequential representation of the spatial illumination distribution on detector 17 can then be evaluated. If the detector is a chargeable semiconductor plate it can be read out directly by a commercial charge coupled device (CCD) camera which acts as a signal evaluator 41. This signal evaluator furnishes the test result data sequentially to processor/storage unit 33 from where they can be extracted for a final evaluation of the test, or for producing a printout of the test results for the respective board.
FIG. 4 illustrates the different basic testing possibilities which are available when using the testing method of present invention. In FIG. 4A there are shown a few simple connections A1, A2, A3, and A4 between pairs of pads. All of these connections are located at the surface of the board, as can be seen in the sectional side view. For testing, a laser beam is first selectively directed to the left pad of connection A1, A2, or A3 in method step I (each connection is separately tested). In the figure, this is indicated by an arrow with an "L". The detection in method step III is indicated by an arrow with a "D". For normal connection A1 the detection will show that the charges have propagated to the right pad (indicated by a "1"). For interrupted connection A2, th expected potential will not be detected at the right pad (indicated by a "0"). For normal connection A3 the result at the right pad is the same as for A1. However, a short circuit is assumed between A3 and A4. Thus, though no laser beam was directed to a pad of connection A4, the detection step after charging a pad of A3 will result in a high potential indication from the pads of A4 (indicated by a "1" on the right pad.
In FIG. 4C, there are shown four buried connections Ba, B2, B3, and B4 between pairs of surface pads. The buried conductors are neither visible nor can they be charged by a laser beam, but they can nevertheless be tested by the method of the invention. The explanations given for FIG. 4A with respect to selective charging of pads by laser and subsequent detection of the resulting potentials on pads apply also to the situation of FIG. 4C.
Of course, a substrate such as a circuit board or a package substrate to be tested can have any combination of the electrical connections shown in FIG. 4A, FIG. 4B, FIG. 4C and FIG. 4D, and there can be more complicated connections (branched conductors, conductor networks, etc.). When the testing is done in suitable sequential steps, each separate "network" can be tested for integrity, and shortcut circuits between "networks" will also be detected easily.
It is of course also possible to test different connecting lines or via connections simultaneously, e.g., if the connections which are tested simultaneously have so much distance from each other that shortcuts between them are not possible.
(4) Comparison of Speeds for E-Beam Testing and for Laser Testing
In E-beam testing technology, there are problems with the separation of high-energy (reflected beam) electrons from low-energy (secondary) electrons if one uses position-sensitive detection. With E-beams, the high-energy electrons of the reflected E-beam (about 1,000 eV) would also reach the channel plates and destroy the voltage contrast information because this information about the voltages is in the low-energy electrons. In photoemission, there are only the electrons emitted with energies in the range 0 eV to 1 eV which also contain the information about the voltages on the surface of the investigated sample.
If the measurement or loading time for a single point is comparable in E-beam and in photoemission technology, the flooding approach which is only useful with optically-excited photoemission leads to a much smaller total measuring time for this latter technique. In testing, one finds that the measuring time for a single spot is four times larger in E-beam technology than with photoemission. For full package testing which allows the flooding approach, the improvement is therefore much larger.
The preferred embodiment of the invention is photoelectrically removing electrons from a conducting pad on a substrate, but not removing electrons from the substrate, to induce a voltage on the pad and thereafter photoelectrically causing a flux of electrons to be emitted from pads on the substrate surface but not from the substrate to distinguish pads which are in electrical connection. It will be recognized by those of skill in the art that other means for contactless, generating charges in a pad and for contactlessly generating an electron flux can be used to practice the invention, such as for example using a fine positively charged probe tip to extract electrons from a pad and thermionically causing electrons to escape from the contact pads by localized heating of the substrate.
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subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufactureUS9250064Oct 23, 2014Feb 2, 2016Attofemto, Inc.Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devicesUS9366719Dec 17, 2013Jun 14, 2016Attofemto, Inc.Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devicesUS20040036862 *Aug 23, 2002Feb 26, 2004Ted LiangMethod to inspect patterns with high resolution photoemissionUS20040225400 *May 6, 2003Nov 11, 2004Visteon Global Technologies, Inc.Non-contact optical system for production testing of electronic assembliesUS20050156609 *Feb 3, 2005Jul 21, 2005Paul PfaffVoltage testing and measurementUS20050231733 *Mar 4, 2003Oct 20, 2005Paul PfaffNon-destructive testing systemUS20060244974 *Mar 31, 2006Nov 2, 2006Attofemto, Inc.Non-destructive testing systemUS20100091292 *Apr 10, 2009Apr 15, 2010Attofemto, Inc.Holographic condition assessment system for a structure including a semiconductor materialUS20110122415 *May 26, 2011Attofemto, Inc.Method for optically enhanced holograhic interferometric testing for test and evaluation of semiconductor devices and materialsCN100502021CJun 13, 2006Jun 17, 2009佳能株式会社Electromagnetic radiation detection device, radiation detection device and system, and laser processing methodWO1997003365A2 *Jul 11, 1996Jan 30, 1997Exsight Electro Optical Systems Ltd.Laser-induced metallic plasma for con-contact inspectionWO1997003365A3 *Jul 11, 1996Apr 10, 1997Exsight LtdLaser-induced metallic plasma for con-contact inspection* Cited by examinerClassifications U.S. Classification250/358.1, 324/501, 324/96, 702/117, 356/389, 324/763.01, 324/754.23, 324/750.14International ClassificationG01R31/308, G01N23/22, H01L21/66, H05K3/00, G01R31/02Cooperative ClassificationG01R31/308European ClassificationG01R31/308Legal EventsDateCodeEventDescriptionNov 23, 1987ASAssignmentOwner name: INTERNATONAL BUSINESS MACHINES CORPORATION, ARMONKFree format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNORS:BEHA, JOHANNES G.;BLACHA, ARMIN U.;CLAUBERG, ROLF;AND OTHERS;REEL/FRAME:004788/0372;SIGNING DATES FROM 19871027 TO 19871119Owner name: INTERNATONAL BUSINESS MACHINES CORPORATION, ARMONKFree format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:BEHA, JOHANNES G.;BLACHA, ARMIN U.;CLAUBERG, ROLF;AND OTHERS;SIGNING DATES FROM 19871027 TO 19871119;REEL/FRAME:004788/0372Sep 30, 1992FPAYFee paymentYear of fee payment: 4Sep 23, 1996FPAYFee paymentYear of fee payment: 8Jan 16, 2001REMIMaintenance fee reminder mailedJun 24, 2001LAPSLapse for failure to pay maintenance feesAug 28, 2001FPExpired due to failure to pay maintenance feeEffective date: 20010627RotateOriginal ImageGoogle Home - Sitemap - USPTO Bulk Downloads - Privacy Policy - Terms of Service - About Google Patents - Send 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Hashbrowns and Biscuits & Gravy worth the travel time! - Review of Raging River Cafe, Fall City, WA - TripAdvisor
Hashbrowns and Biscuits & Gravy worth... - Raging River Cafe
“Hashbrowns and Biscuits & Gravy worth the travel time!”
Review of Raging River Cafe
Ranked #1 of 8 Restaurants in Fall City
AussieBushBaby
Hashbrowns and Biscuits & Gravy worth the travel time!
This place is just a jem! I had read some reviews on their hashbrowns being the best ever and thought I should try it. I am a hashbrown snob and am usually unimpressed with the hashbrowns when eating out. The verdict..I will ALWAYS order them here. I ordered them extra crispy and that is exactly how they came. I also will always order the biscuits and gravy as they are almost as good as mine. Most places have the cream gravy with not a lot of flavour, but theirs is golden and full of flavour! Also the service is OUTSTANDING!!
Ask AussieBushBaby about Raging River Cafe
Thank AussieBushBaby
All reviews breakfast hash browns french toast pot roast sandwich patty melt soup chicken fish and chips biscuits lunch and dinner ate here big portions live entertainment friendly small town service was prompt based on reviews
Tastes good. Not bad price. Try the sausage.
My Dad ate here while I was in the library and raved about how friendly they were and good the food was. So later I took him and the family back. Actually, he paid. Anyway, we all enjoyed the food. Big portions and quite yummy. Amongst us all we had spinach omelet, corned beef hash, and a spicy sausage all tasty, plus the regular fixins. The service had a few mix ups (forgot to bring coffee or take our order, and then brought me somebody else's bill and credit card) but we were relaxed that morning and didn't have to mind.
Ask BigCitiesBoy about Raging River Cafe
I were driving on our way to Monroe, Wa, when we found out the the road was closed. So, we found this restaurant and decided to eat there. The service was very good and the food and good for it's price. I had a great time there.
Ask Anthony L about Raging River Cafe
We have been there for breakfast 3 times in the past month. Everyone in our party was very pleased with their meal. The hash browns are as good as I have ever had. The service is excellent. They treat you like long lost friends.
Ask kpete46 about Raging River Cafe
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59 terror camps active across LoC: Mukherjee | india | Hindustan Times
59 terror camps active across LoC: Mukherjee
India has often accused Pak of failing to deliver on its Jan 2003 commitment that it would not be aiding terrorists.
india Updated: May 09, 2006 22:07 IST
Stating that 59 terrorist training camps were operational across the Line of Control (LoC), Defence Minister Pranab Mukherjee on Tuesday asked Pakistan to demolish the infrastructure of support for terrorists.
Mukherjee also said the Al-Qaeda had 'always been a threat to India no matter where it was based'.
Briefing the media at the airport after visiting Kulhand in Doda district and Basantgarh in Udhampur district where terrorists had killed 32 Hindus last week, he said that he would like to remind Pakistan that terrorists "are not the friends of anybody. Cross-border terrorism had no affiliation and terrorists are a menace for the world."
Pakistan should not allow terrorists to use its territory, and their infrastructure should be demolished so that a message is sent out that terrorists have no support, he added.
New Delhi has often accused Islamabad of failing to deliver on its January 2003 commitment that it would not allow terrorists to operate from its territories. Pakistan denies the Indian charge.
Stating that he did not want to interfere in the internal affairs of Pakistan, Mukherjee said that no state should support terrorism as part of state policy. "If it does, it will have to pay the penalty," he said in reply to a question.

value: This website is an Indian English-language daily newspaper introduced and founded in 1924 by Sunder Singh Lyallpuri, founder-father of the Akali movement and the Shiromani Akali Dal in the Punjab Province. It played integral roles in the Indian independence movement as a nationalist daily.


text:
Ashok R. Venkitaraman10
Robert Abel9
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8Ashok R. Venkitaraman
7Nobuyuki Matubayasi
7Crystal Nguyen
7Bin W. Zhang
Correlations in liquid water for the TIP3P-Ewald, TIP4P-2005, TIP5P-Ewald, and SWM4-NDP models.
Water is one of the simplest molecules in existence, but also one of the most important in biological and engineered systems. However, understanding the structure and dynamics of liquid water remains… (More)
Protein-protein interactions (PPIs) have been identified as a vital regulator of cellular pathways and networks. However, the determinants that control binding affinity and specificity at protein… (More)
David J. Huggins, Woody Sherman, Bruce Tidor
David J. Huggins,*,†,‡,∞ Woody Sherman,* and Bruce Tidor* †Department of Oncology, Hutchison/MRC Research Centre, University of Cambridge, Hills Road, Cambridge, CB2 0XZ, United Kingdom ‡Department… (More)
David J. Huggins, Ashok R. Venkitaraman, David R. Spring
Traditionally a pursuit of large pharmaceutical companies, high-throughput screening assays are becoming increasingly common within academic and government laboratories. This shift has been… (More)
Estimating Translational and Orientational Entropies Using the k-Nearest Neighbors Algorithm.
Inhomogeneous fluid solvation theory (IFST) and free energy perturbation (FEP) calculations were performed for a set of 20 solutes to compute the hydration free energies. We identify the weakness of… (More)
Distance metrics facilitate a number of methods for statistical analysis. For statistical mechanical applications, it is useful to be able to compute the distance between two different orientations… (More)
Siniša Vukovič, David J. Huggins
Ligandability is a prerequisite for druggability and is a much easier concept to understand, model and predict because it does not depend on the complex pharmacodynamic and pharmacokinetic mechanisms… (More)
Understanding and modelling protein folding remains a key scientific and engineering challenge. Two key questions in protein folding are (1) why many proteins adopt a folded state and (2) how these… (More)

value: This website is an artificial-intelligence backed search engine for academic publications developed at the Allen Institute for AI and publicly released in November 2015. It uses advances in natural language processing to provide summaries for scholarly papers.


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Flip Flop Pinteres | eBay Please enable JavaScript Our new search experience requires JavaScript to be enabled. Please enable JavaScript on your browser, then try again.
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value: This website is an American multinational e-commerce corporation based in San Jose, California, that facilitates consumer-to-consumer and business-to-consumer sales through its website.


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What should I do if I don't know "how I fall asleep?" : LucidDreamingjump to contentmy subredditsannouncementsArtAskRedditaskscienceawwblogbookscreepydataisbeautifulDIYDocumentariesEarthPornexplainlikeimfivefoodfunnyFuturologygadgetsgamingGetMotivatedgifshistoryIAmAInternetIsBeautifulJokesLifeProTipslistentothismildlyinterestingmoviesMusicnewsnosleepnottheonionOldSchoolCoolpersonalfinancephilosophyphotoshopbattlespicsscienceShowerthoughtsspacesportstelevisiontifutodayilearnedTwoXChromosomesUpliftingNewsvideosworldnewsWritingPromptsedit subscriptionsfront-all-random | AskReddit-worldnews-funny-pics-videos-movies-todayilearned-news-gifs-aww-Showerthoughts-gaming-mildlyinteresting-television-Jokes-tifu-IAmA-OldSchoolCool-LifeProTips-Music-photoshopbattles-nottheonion-food-explainlikeimfive-science-InternetIsBeautiful-TwoXChromosomes-sports-books-Futurology-personalfinance-UpliftingNews-EarthPorn-WritingPrompts-askscience-space-dataisbeautiful-DIY-creepy-nosleep-GetMotivated-Art-Documentaries-gadgets-listentothis-history-philosophy-announcements-blogmore » LucidDreamingcommentsWant to join? Log in or sign up in seconds.|Englishlimit my search to /r/LucidDreaminguse the following search parameters to narrow your results:subreddit:subredditfind submissions in "subreddit"author:usernamefind submissions by "username"site:example.comfind submissions from "example.com"url:textsearch for "text" in urlselftext:textsearch for "text" in self post contentsself:yes (or self:no)include (or exclude) self postsnsfw:yes (or nsfw:no)include (or exclude) results marked as NSFWe.g. subreddit:aww site:imgur.com dogsee the search faq for details.advanced search: by author, subreddit...this post was submitted on 16 Nov 201310 points (100% upvoted)shortlink: remember mereset passwordloginSubmit a new text postLucidDreamingsubscribeunsubscribe148,179 readers~42 users here nowAll about Lucid Dreams. How to, sǝɔuǝıɹǝdxǝ, etc.
created by OsakaWilsonThe projector is always on.a community for 7 yearsmessage the moderatorsMODERATORSOsakaWilsonThe projector is always on.TheonWILDOOBELDMILDRCDJFILDerBlazingFireStormFlying - Chronicle styleTheLucidSageEven day dreaming about lucid dreamingabout moderation team »discussions in /r/LucidDreaming<>X28 points · 2 comments Had my first lucid dream. Woke myself up by laughing too hard.15 points · 9 comments [QUESTION] How long did it take you to achieve your first Lucid Dream from the time you started induction/initiation practices?16 points · 5 comments I have a hard time becoming lucid because of video games.18 points · 14 comments How long do you feel like you've been in the dream world?2 points · 1 comment Have had natural lucid dreams almost monthly my whole life, is it pushing it to try to have more?Had my first lucid dream!New to Lucid Dreaming34 points · 5 comments Help with starting off a dream lucid?12 points · 2 comments Had my first lucid dream!!4 points · 4 comments Isn't it weird?This is an archived post. You won't be able to vote or comment.
91011What should I do if I don't know "how I fall asleep?" (self.LucidDreaming)submitted 2 years ago by mrkeesSorry if the post title is confusing. I have been trying lucid dreaming for years, and only had a couple dreams where I was vaguely aware; and even then I have never intentionally induced a LD. The closest I've gotten to success recently is using WILD, but even that's not working other than that kind of weird, floating feeling while still completely conscious. My problem is partly that I have no idea when I am "falling asleep." Every night I remember laying in my bed for quite a while (I have difficulty falling asleep anyway) and then the next thing you know, bam I'm awake with a few vague memories of dreams. As I'm falling asleep, I have no conscious thoughts telling me I'm getting close to being asleep and not just zoned out in my bed. This happens even if I use an alarm to wake myself up at whatever specific time in the the middle of the night to try to LD, when I'm falling asleep faster. This doesn't seem to be that normal, as most guides and tips reference things like "as you feel yourself start to fall asleep" or similar things. Is anyone similar to me like this, and how have you overcome this to successfully lucid dream?
8 commentsshareall 8 commentssorted by: besttopnewcontroversialoldrandomq&a[–]leoinkerBorn Dreaming 1 point2 points3 points 2 years ago (3 children)There are a ton of things you can try!
If you want to chemically aid your induction, there are many things that can be tried. Lavender oil, Frankincense, Myrrh, Nutmeg oil, drugs(especially weed), alcohol, nicotine, caffeine, pharmaceuticals(not recommended), Chamomile oil or tea, vitamins and supplements, etc. - There are SO MANY different things that may affect you ability to lucid dream.
Non-chemical aids include: meditation, music, self-hypnosis, notes, alarms, massage, etc!
Your activities throughout the day may have an effect as well. If you are physically active all day, you need to sleep so that your body may cleanse and repair itself. - This seems to make it more difficult to induce a lucid dream.
permalinkembedsavegive gold[–]mrkees[S] 0 points1 point2 points 2 years ago (2 children)Thanks. I'll look into chemically inducing lucid dreams, for now I have not done anything except "natural" methods.
permalinkembedsaveparentgive gold[–]leoinkerBorn Dreaming 0 points1 point2 points 2 years ago (1 child)By "chemically", I mean using any chemical to alter your current state, whether it's naturally occurring or not.
permalinkembedsaveparentgive gold[–]mrkees[S] 0 points1 point2 points 2 years ago (0 children)Yeah I know
permalinkembedsaveparentgive gold[–]friedsushi87 0 points1 point2 points 2 years ago (3 children)Some things that have helped me lucid dream. Take a nap during the day. Sometimes an extra hour or two can affect night time sleeping. Nicotine. Smoke a cigarette. Reality check religiously. Read about lucid dreaming before bed. Have totems go off all night from a lucid dream app. Put a pen and paper near your bed. Put a sign on the ceiling /door to remind you to write down dreams..... permalinkembedsavegive gold[–]mrkees[S] 2 points3 points4 points 2 years ago (2 children)Hm. I'll be sure to try most of these but cigarettes? That actually helps? That seems like if anything it would suppress your dreams. I don't really want to start smoking, anyway.
permalinkembedsaveparentgive gold[–]friedsushi87 -3 points-2 points-1 points 2 years ago (1 child)I've noticed much more vivid dreams and recall more dreams after smoking a cigarette. Also, some times I repeatedly awake in the middle of the night, but am able to go back to sleep immediately, allowing me to fild and become lucid. You don't have to start smoking, and a cigarette before bed once or twice a week will not hurt you. Might I recommend ecigg vapor to avoid harsh smoke. Or hookah. Hookah is very relaxing, enjoyable, and isn't habitual like cigarettes. http://www.ncbi.nlm.nih.gov/m/pubmed/16782142/
permalinkembedsaveparentgive gold[–]drogbad 1 point2 points3 points 2 years ago (0 children)As an ex smoker, I would beg you not to get addicted to nicotine for any purpose. Being hooked on cigarettes is a perpetual lucid nightmare where you can't control your own actions.
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Hydrogen-peroxide-based gel & cold blue light work to whiten teeth by two–eight shades while avoiding heightened tooth sensitivity
Teeth become discolored after years of drinking coffee, and seconds after growling at a squid. Brighten the results of marine mishaps with today’s Groupon: for $49, you get an in-office teeth-whitening treatment at SmileLabs, valid at locations in Sioux Falls and Mitchell (a $99 value).
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Cheap flights from Kiev to Atlanta - $640 and up - TripAdvisor - [IEV - ATL]
Cheap flights from Kiev (IEV) to Atlanta (ATL) Review
Cheap flights from Kiev to AtlantaRound TripOne-wayMulti-city 08/11/201608/18/2016 08/11/2016 08/11/2016 Economy Premium Economy Business Class First Class Prefer nonstop 1 Person Adults (18-64) -1+Seniors (65+) -0+Children (0-17) -0+*Specify the age of each child at the time of travel. Age ? Age ? < 11234567891011121314151617Child 1 Age ? Age ? < 11234567891011121314151617Child 2 Age ? Age ? < 11234567891011121314151617Child 3 Age ? Age ? < 11234567891011121314151617Child 4 Age ? Age ? < 11234567891011121314151617Child 5 Close More OptionsEconomy Premium Economy Business Class First Class Prefer nonstop Include nearby airports My dates are flexibleLess optionsGet an alert when prices drop. Get an alert when Kiev to Atlanta prices drop. Search Flights Why TripAdvisor Flights?
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find price About TripAdvisor Flights Your one-stop shop for finding the best flights from Kiev to Atlanta. Simply tell us where and when you want to travel and we'll do all the legwork for you. Featuring the most powerful shopping tools on the web, we search the largest online travel websites, established airfare discounters, plus the world's leading airlines and low-cost carriers to bring back thousands of flight options. 1 Traveler
Travel information for Kiev, Ukraine to Atlanta
Kiev, Ukraine is 5407 miles from Atlanta
Tbilisi, Georgia - Novo Alexeyevka is the most popular connection for one stop flights between Kiev, Ukraine and Atlanta
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Patent US7785325 - Multi-articulated fracture fixation device with adjustable modulus of rigidity - Google PatentsSearch Images Maps Play YouTube News Gmail Drive More »Sign inAdvanced Patent SearchPatentsA multi-articular intramedullary fracture fixation device having a adjustable modulus of rigidity. The implant apparatus includes modular tensioning elements that can be disposed in a ball-and-socket linear array along a length of connecting wire within a medullary canal. The connecting wire includes...http://www.google.com/patents/US7785325?utm_source=gb-gplus-sharePatent US7785325 - Multi-articulated fracture fixation device with adjustable modulus of rigidityAdvanced Patent SearchPublication numberUS7785325 B1Publication typeGrantApplication numberUS 11/671,420Publication dateAug 31, 2010Filing dateFeb 5, 2007Priority dateFeb 3, 2006Fee statusPaidPublication number11671420, 671420, US 7785325 B1, US 7785325B1, US-B1-7785325, US7785325 B1, US7785325B1InventorsMiles C. MilbankOriginal AssigneeMilbank Miles CExport CitationBiBTeX, EndNote, RefManPatent Citations (15), Referenced by (17), Classifications (7), Legal Events (1) External Links: USPTO, USPTO Assignment, EspacenetMulti-articulated fracture fixation device with adjustable modulus of rigidityUS 7785325 B1Abstract A multi-articular intramedullary fracture fixation device having a adjustable modulus of rigidity. The implant apparatus includes modular tensioning elements that can be disposed in a ball-and-socket linear array along a length of connecting wire within a medullary canal. The connecting wire includes a threaded end and a stop member at the opposite end, and when a lock nut is threadably disposed on the threaded end and tightened, at least two of the tensioning elements in the array may be swiveled relative to one another and arranged to introduce curvature as desired along the length of the array. Tightening the lock nut is also employed to adjust the modulus of rigidity to be retained during healing.
CROSS REFERENCES TO RELATED APPLICATIONS The present application claims the benefit of the filing date of U.S. Provisional Patent Application Ser. No. 60/765,413, filed Feb. 3, 2006.
BRIEF SUMMARY OF THE INVENTION The present invention is a novel and improved surgical method and apparatus which provides a solution to the above-described problem. Summarily stated, the present invention is an intramedullary fracture fixation device capable of being implanted in an entirely flexible condition, and after implantation locked into a rigid form when the surgeon is satisfied with the position of the fracture reduction. The device comprises, in its most essential form, a segmented flexible column made rigid by tensioning an axially disposed flexible rod. Such columns are known in the art, but not in the context of medical procedures and, most pertinently, not for use in the reduction of bone fractures. The advantage of using a flexible column for reducing a fracture is that the attending surgeon retains considerable control over the final positioning of the apparatus. If, for any reason he finds the implanted position unsatisfactory after initially locking in the configuration, the device can be unlocked, repositioned, and locked again. This procedure can be repeated until the surgeon is satisfied with the result.
DETAILED DESCRIPTION OF THE INVENTION Referring to FIGS. 1 through 11, wherein like reference numerals refer to like components in the various views, there is illustrated therein a new and improved multi-Articulated fracture fixation device with adjustable modulus of rigidity, generally denominated 100 herein. These views show, collectively, an adaptable and easily customized mechanical device adapted for implantation in the medullary cavity of long bone for the purpose of reducing bone fractures.
Patent CitationsCited PatentFiling datePublication dateApplicantTitleUS3283640 *Feb 10, 1965Nov 8, 1966Teizo OnoAnchor boltUS3846846 *Sep 26, 1973Nov 12, 1974Fischer ArturHip joint prosthesisUS3858578 *Jan 21, 1974Jan 7, 1975Pravel Wilson & MatthewsSurgical retaining deviceUS4190044Aug 16, 1978Feb 26, 1980Wood Eugene WTelescoping intermedullary pinUS5645545Aug 14, 1995Jul 8, 1997Zimmer, Inc.Self reaming intramedullary nail and method for using the sameUS5649925 *May 12, 1995Jul 22, 1997Jose Vicente Barbera AlacreuSystem for setting cervical vertebrae from behindUS5879352 *Jun 17, 1997Mar 9, 1999Synthes (U.S.A.)Osteosynthetic longitudinal alignment and/or fixation deviceUS5997582May 1, 1998Dec 7, 1999Weiss; James M.Hip replacement methods and apparatusUS6120504Dec 10, 1998Sep 19, 2000Biomet Inc.Intramedullary nail having dual distal bore formationUS6296644 *Feb 25, 2000Oct 2, 2001Jean SauratSpinal instrumentation system with articulated modulesUS6443992 *Apr 4, 2001Sep 3, 2002Philipp LubinusMilling tool for emptying the femoral medullary space and hip prosthesis to be inserted in the space createdUS6755862 *Jul 2, 2002Jun 29, 2004Orthoscope Ltd.Intramedullary support strutUS20030109932 *Jul 2, 2002Jun 12, 2003Ory KeynanIntramedullary support strutUS20050038432 *Aug 15, 2003Feb 17, 2005Shaolian Samuel M.Articulating spinal fixation rod and systemUS20080294163 *Jul 11, 2006Nov 27, 2008Siaw Meng ChouIntramedullary Fixation Device for Fractures* Cited by examinerReferenced byCiting PatentFiling datePublication dateApplicantTitleUS8267967 *Dec 15, 2005Sep 18, 2012Stryker SpineMethods and apparatus for modular and variable spinal fixationUS8298264 *Sep 7, 2006Oct 30, 2012Warsaw Orthopedic, IncSystems and methods for use in spinal supportUS8568452 *Mar 28, 2012Oct 29, 2013Rand M. VoorhiesLumbar disc replacement implant for posterior implantation with dynamic spinal stabilization device and methodUS8685022 *Jun 17, 2009Apr 1, 2014Kai Uwe LorenzDevice for externally fixing bone fracturesUS8709055Jan 18, 2010Apr 29, 2014Carbofix Orthopedics Ltd.Composite material bone implantUS20060142760 *Dec 15, 2005Jun 29, 2006Stryker SpineMethods and apparatus for modular and variable spinal fixationUS20080071275 *Oct 31, 2007Mar 20, 2008Nu Vasive, Inc.Spinal alignment system and related methodsUS20100160967 *Dec 22, 2009Jun 24, 2010Joseph CapozzoliVariable tension spine fixation rodUS20110022078 *Jul 23, 2009Jan 27, 2011Cameron Dale HinmanArticulating mechanismUS20110144643 *Jun 17, 2009Jun 16, 2011Kai-Uwe LorenzDevice for externally fixing bone fracturesUS20120203345 *Mar 28, 2012Aug 9, 2012Voorhies Rand MLumbar Disc Replacement Implant for Posterior Implantation with Dynamic Spinal Stabilization Device and MethodUS20120310283 *May 25, 2012Dec 6, 2012Morreale Vittorio MSegmental spinal fixation system and a method of fixating a plurality of spinal segmentsUS20130041469 *Aug 2, 2012Feb 14, 2013Jeff PhelpsInterbody axis cageUS20130090690 *Sep 12, 2012Apr 11, 2013David A. WalshDynamic Rod AssemblyUS20130103091 *Oct 20, 2011Apr 25, 2013Frank Lugo ACOSTA, JR.Spinal fusion instrumentation and systems and methods thereofWO2012107913A2Feb 13, 2012Aug 16, 2012Carbofix Orthopedics Ltd.Flexible transparent bone implantWO2014025111A1 *Feb 7, 2013Feb 13, 2014Snu R & Db FoundationStructure having variable rigidity* Cited by examinerClassifications U.S. Classification606/62, 403/123, 606/259International ClassificationA61B17/72Cooperative ClassificationA61B17/7216, A61B17/7208European ClassificationA61B17/72BLegal EventsDateCodeEventDescriptionFeb 20, 2014FPAYFee paymentYear of fee payment: 4RotateOriginal ImageGoogle Home - Sitemap - USPTO Bulk Downloads - Privacy Policy - Terms of Service - About Google Patents - Send FeedbackData provided by IFI CLAIMS Patent Services©2012 Google

value: This website is a search engine provided by Google. Handling over 3.5 billion searches per day, it has a 92% share of the global search engine market.


text:
She Dish | Etsy
chaos, intention, love, glass, clay, pottery, ceramic
She is an ongoing series of boat/beach/body-like dishes, stacked or hung. Thrown, cut, stretched and tossed - like a body, a shoreline, and beach glass - they becomes beautiful through rough trade.
Each dish is thrown on the potters wheel then altered and sculpted to its unique shape. White ceramic, with clear glaze and blue beach glass on the inside - like a shimmering tilde pool. A beautiful display for jewellery, candles, crystals or incense.
Choose one dish, or buy several to display together. (Price listed is for one dish)
Dimensions: pictured in group stack, from bottom to top
13” L x 5.5” W x 3” H
13.5”x4.5”x2.5”
10”x6”x2”
9.5x3.5”2.5”
9”x3”x1.5 (Sold)
Not recommended for food, dishwasher, oven or microwave. Hand wash.
Ilena Lee the Potter
CA$1.99 FREE delivery

value: This website is an American e-commerce company focused on handmade or vintage items and craft supplies.


text:
Burnt Carrot Salad | Recipes | Food & Drink | Fox News
By Jamie Sylves, Clara Mae James
The charred flavor of the sweet carrots goes perfectly with the creamy avocado and pickled red onions, and the pumpkin seeds deliver a satisfying crunch that you'll want seconds and thirds of. (Jamie Sylves, Clara Mae James)
"A trip to Cincinnati inspired this recipe and a newfound love for carrots. The familiar taste of pumpkin seeds and the smokey char on the carrots is perfect for this time of year," says Jamie Sylves of Clara Mae James. "It's a well-balanced dish with warm fall flavors that just looks fancy no matter how you plate."
Crumpled feta (optional if vegan)
Pickle onions: Boil 2-3 cups of water. Peel and thinly slice the onion into approximately 1/4" moons. Peel and cut the garlic clove in half. In the container you will be using to store the onions, add the sugar, salt, vinegar, garlic and peppercorns. Stir to dissolve. Place the onions in a colander and place the colander in the sink. Slowly pour the boiling water over the onions and let them drain. Add the onions to the jar and stir gently to evenly distribute the flavorings. The onions will be ready in about 30 minutes, but are better after a few hours. Store in the refrigerator.
Wash and peel carrots before cutting into three-inch sticks, making sure they aren't too thin that they could fall through the grill.
Prepare the carrots with a little salt, pepper and olive oil in a bowl then throw on a hot grill, rotating every few minutes. Once almost burnt, remove the carrots and begin to plate.
Place a handful of cilantro, somewhat de-stemmed, on the plate, followed by a few slices of avocado and pickled onions. Position about six carrot sticks on the pile and garnish with feta and pumpkin seeds.

value: This website is an American multinational conservative cable news television channel based in New York City. It is owned by Fox News Media, which itself is owned by the Fox Corporation.


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text:
Arktikugol - Wikipedia, the free encyclopedia
www.arcticugol.ru
1.2 Pre–Second World War
1.4 Post-dissolution
The first Russian expedition to Svalbard in lieu of exploring for coal mining was conducted by Vladimir Alexandtrovitch Rusanov in 1912. It explored the areas around Bellsund and van Mijenfjorden.[1] It later went northwards to Isfjorden and visited Grønfjorden and Adventfjorden, and it occupied a claim at Colesbukta on 7 August.[2] On 16 March 1913 the financiers of the expedition established the company Handelshuset Grumant – A. G. Agafeloff & Co. to exploit the mine.[3] They sent an expedition that summer and started breaking coal at Colesbukta with a force of 25 men.[4] In 1920 The Anglo Russian Grumant Company Ltd. was established to purchase the operations at Grumant, the mining town which grew up at Colesbukta.[5] At the time a challenge for the Russian interests on Spitsbergen was that the Soviet Union was not yet party to the Svalbard Treaty.[6]
In 1925 the company sold its rights around Kvalvågen and Agarddhbukta to Severoles, which created the Moscow-based company Russki Grumant Ltd.[7] It issued a series of claims to the Commissioner of Mines, most of which were contested by the Government of Norway and various mining companies.[8] A particular intense issue was that of what would become the settlement of Pyramiden on Billefjorden. Both Svenska Stenkolsaktiebolaget Spetsbergen and Severoles claimed the area.[9] In a settlement, Severoles was given the claims to Pyramiden. The Government of Norway protested, stating that a foreign state could not claim land on Svalbard. Thus Russki Grumant took over the claims.[10] By 1927 all Russian claim disputes were resolved.[11]
The Russian authorities announced on 22 June 1931 that the company Sojusljesprom would be operating Grumant. The first shipment of crew arrived on 12 July. Work started immediately to build a settlement, while a port was to be built at Colesbukta, 5 kilometers (3 mi) away.[11] The first season was regarded as a trial. On 17 November 1931 The Anglo Russian Grumant Co. sold all its mining claims to the newly established Arktikugol.[12] The company had been incorporated on 7 October the same year and had its head office in Moscow.[citation needed]
Pre–Second World War[edit]
Barentsburg Harbor
Barentsburg was established by the Nederlandsche Spitsbergen Compagnie, who closed operations in 1926.[12] The company announced in 1931 that the town was for sale, and Arktikugol offered to purchase the entire company. Barentsburg was sold on 25 July 1932, including the claims and land at Bohemanflya.[13] When purchasing Grumant, the Russian company had agreed to forfeit its right to operate a long-distance radio station.[14] This arrangement did not apply to Barentsburg, allowing Arktikugol to establish a telegraphy station there. The issue was raised to a diplomatic level, but resolved itself after it became clear that Grumant Radio would only be relaying via Barentsburg.[15] Arktikugol continued to build infrastructure in Grumant and mined ca. 10,000 tonnes of coal in the winter of 1931–32.[16]
The remains of Grumant
By 1932 the population had reached 300 in Grumant and 500 in Barentsburg. The company had commenced prospecting in Colesbukta, and hoped to bring production to 120,000 tonnes from Grumant and 300,000 tonnes from Barentsburg per year.[16] The Governor of Svalbard conducted the first inspection of the two towns in July 1933.[17] By the winter of 1933–34 the population of Barentsburg had risen to 1,261, including about 100 children. The summer population was about 1,500, and the mines produced 180,000

value: This website is the English-language edition of the free online encyclopedia Wikipedia. It was founded on 15 January 2001 as Wikipedia's first edition and, as of October 2021, has the most articles of any edition, at 6,412,521.


text:
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Energy Medicine: Balancing Your Body's Energies for Optimal Health, Joy, andVitalityUpdated and Expanded by Donna Eden, David Feinstein | | 9781585426508 | Paperback | Barnes & Noble
Energy Medicine: Balancing Your Body's Energies for Optimal Health, Joy, andVitalityUpdated and Expanded
In this updated and expanded edition of her alternative-health classic, Eden shows readers how they can understand their body's energy systems to promote healing.See more details below
Energy Medicine: Balancing Your Body's Energies for Optimal Health, Joy, andVitalityUpdated and Expanded available in
"Eden delivers an excellent, comprehensive guide to a unique combination of ancient Eastern and modern Western health-care techniques."PUBLISHERS WEEKLY"Even the most hard-nosed doctor will admit that some people have a healing presence that makes usand our immune systemsbetter than before. Donna Eden is one of those rare healers."Gloria Steinem"It's time for minds to open and bodies to heal. Read, listen and explore your intimate ghealing abilities."Bernie Siegel, M.D., author of Love, Medicine and Miracles"Donna Eden is one of the most joyous and effective pioneers in the rapidly expanding and vitally important frontier called energy medicine. This book, the classic in hands-on energy medicine, is an enormously practical guide that sings with compassion, integrity, and wisdom."Christiane Northrup"Donan Eden's body-energy work is perhaps the most brilliant, comprehensive and effective system in the genre that I have ever seen."Jean Houston, The Possible Dream
Therapeutic touch->Popular works
Donna Eden is among the world's most sought after, authoritative and joyous spokespersons for energy medicine. Her abilities as a healer are legendary. She has taught some 50,000 people worldwide, both laypeople and professionals, how to understand the body as an energy system. David Feinstein, Ph.D., is a clinical psychologist who serves as national director of the Energy Medicine Institute. Gary Craig is the founder of Emotional Freedom Techniques (EFT), the most widely used of all the techniques within the burgeoning new field of energy psychology.

value: This website is an American bookseller. It is a Fortune 1000 company and the bookseller with the largest number of retail outlets in the United States.


text:
Samsonite Lift2 Spinner - Luggage | eBay
samsonite (20890 )
Details about Samsonite Lift2 Spinner - Luggage
- Select - Black[out of stock] Blue Red
- Select - 21" 25"[out of stock] 30"[out of stock]
Limited quantity available / 1,309 sold / See feedback
US $175.01 (70% off)
123300121746
Last updated on Jul 19, 2019 18:32:59 PDT View all revisions
Material: Polyester/Nylon Item Width: 15.00
Style: Luggage MPN:
58745XXXX
Great seller. Fast and easy transaction
Terrible!!! They received return on June 25th and still no refund or response
False info about size. Upon bringing into seller's notice told that's how it is.
T shirt smelled nasty and worned . The collar area was very dirty. Worned .
I ordered a 30" piece of luggage and a 29" piece was sent.


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Craftsman V 43785 Vintage 3 8"Dr Ratchet | eBay Skip to main contenteBayShop by categoryEnter your search keywordAll CategoriesAdvanced or register':' style="margin-right:3px">Hi -User-!'.replace(/-User-/,escape(a)))+"")}catch(b){document.write("")}})();Hi (Sign in to bid or buy)Daily DealsGift CardsSellHelp & ContactMy eBayExpand My eBaySummaryBids/OffersWatch listWish listAll listsPurchase historySellingMy CollectionsFollowed searchesMessagesNotification Back to home page
Details about Craftsman -V- 43785 Vintage 3/8"dr Ratchet
Craftsman -V- 43785 Vintage 3/8"dr Ratchet
eBay item number:110830403215


text:
Encore in Boston Could Set a Tone
When it was suggested that Saturday's 85-78 win over the Boston Celtics was a "signature" victory for his team, Washington Wizards Coach Eddie Jordan pondered the idea for a moment before responding.
"You know, a signature win catapults you," Jordan said. "We have to see if this catapults us. I've seen major wins go down the drain in the next few weeks so for us, it's where do you go from here?"
Jordan and the Wizards (19-16) will discover the answer to that question quickly because they face the Celtics (30-5) tonight in Boston. Previously, Washington's most impressive win this season was a 110-98 victory at Dallas on Nov. 26. However, they lost, 109-94, at San Antonio two nights later and then fell, 85-84, at Philadelphia on Nov. 30.
Prior to Saturday night, the Wizards had not defeated a team with a winning record since Dec. 1, when they beat Toronto, 101-97.
Clutch From the Line
After making 22 of 25 free throw attempts in Friday's overtime win over the Hawks, the Wizards connected on 27 of 30 from the line Saturday night. Even better, the Wizards have been clutch when it mattered most. They made 9 of 10 free throws in overtime against the Hawks and 12 of 13 during the fourth quarter against the Celtics.
Guard DeShawn Stevenson, who is a 76.1 percent free throw shooter on the season, made three big ones after drawing a foul while attempting a three-pointer with one minute 14 seconds left Saturday night.
UP NEXT: Today at Celtics 7:30 p.m. Comcast SportsNet, WTEM-980
Tomorrow at Knicks 7:30 p.m. Comcast SportsNet Plus, WTEM-980

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